X-ray Analysis and Particle Characterisation Instruments

The X-ray Analysis and Particle Characterisation lab at CMM is based on level two of the Chemistry building.

We provide a range of X-ray techniques, including diffraction, scattering, spectroscopy and imaging, for studying chemical composition, nano-scale size and crystalline phases in a range of materials. In addition we also have capabilities for particle characterisation, including size and shape analysis and interfacial tension/contact angle. We can also provide access to some partner instruments outside CMM. Please consult the instrument list below, or contact the lab manager if you don’t see the instrument you are looking for here, and we will do our best to direct you to the correct contact.

The lab provides complementary techniques to the electron-based methods afforded by the AIBN, QBP and Hawken Laboratories and to the macromolecular diffraction facilities in the QBP laboratories through small-angle scattering and small-molecule diffraction techniques.

Chemistry Building 68
Level 2
68 Cooper Road 
St Lucia, Queensland 4072

NEW Sample Submission Process:

From Tuesday 22nd April the current paper sample submission forms will no longer be accepted.  Please click here to access the new form.  Once your sample submission request is approved, you will receive an email with a copy of your submission to print and enclose with your samples when you drop them off.