The Frontiers in Microscopy and Microanalysis seminar series introduces the student and staff to advances in microscopy and nanoscopy with an emphasis on light microscopy, electron microscopy and analysis as well as x-ray microscopy and x-ray analytical methods. Both methodological and technological progress as well as applications in various scientific fields will be discussed.
| Date / Time | Location | Speakers | Title | Flyer |
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13/6/18 2pm-4pm |
Level 1 Seminar Room, AIBN Building #75 | Mr Jaap Brink from JEOL USA & Mr S. Motoki from JEOL Ltd | JEOL and the occurrence of the next Ice Age |
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1/6/18 10am-2pm |
Level 1 Seminar Room, AIBN Building #75 |
Presentations from Zeiss, Raith and Witec on |
Supporting Materials Research to Manufacture the Future |
|
|
27/3/18 3-4pm |
Level 1 Seminar Room, AIBN Building #75 | Dr. Patrick Woo | Advances in Imaging & Analytical techniques in Scanning Electron Microscopy |
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