Frontiers in Microscopy and Microanalysis


The Frontiers in Microscopy and Microanalysis seminar series introduces the student and staff to advances in microscopy and nanoscopy with an emphasis on light microscopy, electron microscopy and analysis as well as x-ray microscopy and x-ray analytical methods. Both methodological and technological progress as well as applications in various scientific fields will be discussed.


Date / Time Location Speakers Title Flyer



Level 1 Seminar Room, AIBN Building #75 Mr Jaap Brink from JEOL USA & Mr S. Motoki from JEOL Ltd JEOL and the occurrence of the next Ice Age



Level 1 Seminar Room, AIBN Building #75

Presentations from Zeiss, Raith and Witec on
multimodal and multiscale electron & light microscopy
as well as new frontiers in correlative techniques.

Supporting Materials Research
to Manufacture the Future



Level 1 Seminar Room, AIBN Building #75 Dr. Patrick Woo Advances in Imaging & Analytical  techniques in Scanning Electron Microscopy


Seminars 2017

Seminars 2016