CMM Seminars 2018


The Frontiers in Microscopy and Microanalysis seminar series introduces the student and staff to advances in microscopy and nanoscopy with an emphasis on light microscopy, electron microscopy and analysis as well as x-ray microscopy and x-ray analytical methods. Both methodological and technological progress as well as applications in various scientific fields will be discussed.


Date / TimeLocationSpeakersTitleFlyer


11am - 12pm

Level 1 Seminar Room, AIBN Building #75Professor Richard Tilley, University of New South Wales

Solution Synthesis and Electron Microscopy of Nanoparticle Catalysts



Level 1 Seminar Room, AIBN Building #75Dr William Rickard, Associate Deputy Director, John de Laeter Centre, Curtin UniversityApplication of FIB-SEM based Time of Flight Secondary Ion Spectrometry.



Large QBP Seminar Room 3.142Dr Tadateru Nishikawa SanFrontiers in Spectroscopy - Introduction of the latest JEOL NMR


1 - 5 pm

Level 1 Seminar Room, AIBN Building #75

Christopher Baker, Daniel Szombati, Idriss Blakey, Zibin Chen, Rachpon Kaira, Nit Taksatorn, Christiaan Bekker.

Electron Beam Lithography Workshop
17 - 19 SeptemberLevel 4 Meeting Room, AIBN Building #75Dr James Sagar, Oxford Instruments NanoAnalysis, UKThree Advanced & Extreme EDX Training Lectures for SEM and STEM
5/9/18Level 1 Seminar Room, AIBN Building #75

Dr Hongyi (Justin) Xu from the Department of Materials and
Chemistry, Stockholm University

Fundamentals of Electron Crystallography and Its Application in Structure Determination



Level 1 Seminar Room, AIBN Building #75Mr Jaap Brink from JEOL USA & Mr S. Motoki from JEOL LtdJEOL and the occurrence of the next Ice Age



Level 1 Seminar Room, AIBN Building #75

Presentations from Zeiss, Raith and Witec on
multimodal and multiscale electron & light microscopy
as well as new frontiers in correlative techniques.

Supporting Materials Research
to Manufacture the Future



Level 1 Seminar Room, AIBN Building #75Dr. Patrick WooAdvances in Imaging & Analytical  techniques in Scanning Electron Microscopy