Date/Time: Tuesday 7th February 2023, 14:00 - 16:00 (AEST)
Title: Tensor - STEM done right: an integrated, precession-assisted automated analytical 4D STEM towards 3D-ED
Presenter: Dr Dirk Van der Wal - TESCAN, Brno, Czech Republic
Venue: AIBN Building 75, Level 1 Seminar Room
Zoom: https://uqz.zoom.us/j/89111577549
The global TEM community has long awaited the release of TESCAN’s widely anticipated TEM solution: TESCAN TENSOR - the world’s first integrated, precession-assisted, analytical 4D-STEM.
The methodology behind this advanced (electron diffraction) microscope, and its STEM, 4D-STEM and STEM Tomography applications, will be explained as the solution of choice for a range of nanoscale applications. These include multimodal characterization of functional materials, semiconductor thin films, and submicron, synthetic and natural particle crystal analysis. We will present application examples developed in close collaboration with our Beta partners at the Ernst Ruska Center (Juelich, Germany) and Leeds University (Leeds, UK).
The performance of 4D-STEM acquisition, and data analysis and processing, has been optimized with state-of-the-art technologies, such as electron beam precession (Precession Electron Diffraction, or PED), near real-time (“big-data”) 4D-STEM computing and visualization, and ultra-high vacuum engineering to achieve near UHV at the specimen area.
STEM, 4D-STEM, STEM Tomography and 3D-Electron Diffraction experiments have been made more accessible to novice users of high-end transmission electron microscopes. This is achieved by 9 preset Measurements, enabling a user experience where instrument time is spent on the interaction with the specimen, whilst minimizing interactions with the electron column adjustments and alignments. This new approach empowers an unprecedented level of system accessibility, utilization, and productivity, for a wide range of users without weeks, if not months, of prior training or experience in using complex high-end TEM equipment.
