EDAX webinar: what's important on EBSD - pattern and analysis

28 October 2020

You are invited to an EDAX Webinar on:

What's important on EBSD - Pattern and Analysis

Date: Tuesday 10th of November,

Time: 4-6pm AEST

Speaker: Dr Rene de Kloe

René has been working as applications specialist for EBSD and later also EDS at the EDAX European support office in Tilburg, The Netherlands since 2001. His focus is on instrument demonstrations, conference and workshop presentations, and customer support. This includes (on-site) training courses, assistance with analytical problems, and scientific collaborations. Although focused on Europe, his work has brought him to customers and conferences all over the world. This international travel is a great bonus for his hobby geocaching, where he tries logging at least one cache in every city visited.

As he has always been fascinated by the physical world around him, René has chosen to study geology at Utrecht University with specialization in materials science from a geological perspective.  René’s first introduction to electron microscopy and microanalysis came during his undergraduate thesis on deformation and pressure indicators in natural fault rocks from New Zealand, which involved a significant amount of SEM and TEM work.  Later during his PhD thesis on nanometer-scale melt structures in upper mantle rocks, he also learned about high resolution TEM imaging and EDS analysis.  Around this time, he also started using EBSD on a system without any automation.

Rene’s background in geology gives him a slightly different view on materials research, which has proven invaluable over the years at EDAX. In geology, one must often look at a material without any prior knowledge on how it was formed. Applying this view to man-made materials can be a great help in explaining unexpected test results or materials failures that customers need to understand.


A brief on EBSD detector technologies

CCD,CMOS and Direct Electron Detection

Some thoughts on EBSD pattern generation and collection

Specimen preparation

Information depth

Image resolution, gain and intensity

Background processing

Band detection

Pattern indexing

Orientation precision and scanning strategies

Effect of number of bands

Effect of step size

Dislocation density estimation

Texture analysis

Latest developments in OIM Analysis

Software overview

Off-line reindexing tool with NPAR

OIM Matrix Dynamic EBSD pattern simulations

Question and Answer session

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