PHI nanoTof 3 MS/MS

Instrument ID: https://doi.org/10.48610/7f329ed

Description

The PHI nT3 is a Secondary Ion Mass Spectrometer (SIMS) with a Time-of-Flight (ToF) analyser. It is one of the most surface sensitive analysis techniques, able to provide surface elemental and chemical information by collecting mass spectra from the top ~1 nm of the sample surface (mass resolution dM/M > 8,000). It can perform high spatial resolution imaging (down to x,y ~ 200nm, z < 1 nm) and is equipped with a MS/MS detector for the unambiguous assignment of selected mass peaks.


Location: Long Pocket, Foxtail building, room 221

Contact: Christian van Engers, c.vanengers@uq.edu.au