Hitachi SU7000 FEG SEM (AMICS) with microXray

The Hitachi SU7000 field emission gun (FEG) scanning electron microscope is equipped with two Bruker energy dispersive spectroscopy (EDS) detectors, Esprit EDS analysis software, AMICS automated mineralogy software, and a Bruker Xtrace II xray fluorescence spectrometer. This microscope is ideal for high resolution imaging at nanoscale and detailed chemical analysis. The combination of EDS, XRF, and automated mineralogy software in one analytical instrument significantly improves accuracy of characterisation of low concentration elements and fine-grained materials.

Location: Long Pocket, Foxtail building, room 229

Contact: Matthew Ng , m.ng1@uq.edu.au