JEOL JXA-iHP200F EPMA
The JEOL JXA-iHP200F Electron Probe Microanalyzer is used to analyze elemental compositions and distributions in solid substances and materials. This EPMA is equipped with a field emission electron source (Schottky), five wavelength dispersive spectrometers (WDS), an integrated EDS detector, and an integrated panchromatic cathodoluminescence (CL) detector. Each WDS spectrometer has two extra-large (L type) analysing crystals that allow high count rate and high spectral resolution. The high stability of the emission source and the probe current it produces, together with the large analysing crystals make high X-ray intensities easily achievable with short measurement times compared to a conventional microprobe. This allows faster general/trace element analysis and large area elemental maps.
Location: Hawken Building #50 (Room L105)
Contact: Ron Rasch: r.rasch@uq.edu.au