The 7100 is a Field Emission Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun.  It was installed in 2013 and is ideal for imaging and analysis of micro- and nano-structures.   It has a resolution (sample dependent) of 1.2nm at 30kV and 3.0nm at 1kV.  The 7100 also has a JEOL 129eV resolution silicon drift detector (SDD) for X-ray Energy Dispersive Spectroscope (EDS) microanalysis.


Location: Hawken Building #50 (Room L102)

Contact: Ron Rasch:

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