The 7100 is a Field Emission Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun. It was installed in 2013 and is ideal for imaging and analysis of micro- and nano-structures. It has a resolution (sample dependent) of 1.2nm at 30kV and 3.0nm at 1kV. It is equipped with a GATAN Alto2500 cryo-preparation system for cryo scanning electron microscopy (cryo-SEM) that allows suitable liquid or hydrated specimens to be examined frozen. The 7100 also has a JEOL 129eV resolution silicon drift detector (SDD) for X-ray Energy Dispersive Spectroscope (EDS) microanalysis.
Location: Hawken Building
Contact: Ron Rasch: email@example.com