JEOL JSM-6610 SEM
This is a high resolution, analytical Scanning Electron Microscope that can reach 2.5nm resolution at an accelerating voltage of 30kV. The electron source is a tungsten hairpin gun. Bright, high quality images can be obtained at all kV ranges from 1-30kV. It has a wide magnification range to observe a variety of samples from 10cm in diameter to nano-structures at very high magnification. This instrument is an ideal analytical system as it has an Oxford 50mm2 X-Max SDD x-ray detector attached that enables simultaneous imaging and elemental analysis at high count rates with 125eV energy resolution. It has also has an integrated Oxford/HKL EBSD detector for crystallographic analysis with nanoscale resolution.
Location: Hawken Building
Contact: Ron Rasch: firstname.lastname@example.org