JEOL JSM-6460LA
The 6460 is a variable pressure Scanning Electron Microscope (SEM) with a tungsten filament electron gun. It is a user friendly instrument, ideal for both novice and experienced users. In low vacuum mode, non-conductive and/or uncoated specimens can be imaged and analysed. The 6460 is equipped with a Minicup EDS for X-ray Energy Dispersive Spectroscope (EDS) microanalysis. The 6460 is also outfitted to provide live and interactive electron microscopy sessions for remote researchers, industry representatives, lecturers, education groups and other interested groups via CyberSTEM.
Location: Hawken Building
Contact: Ron Rasch: r.rasch@uq.edu.au