The 7800 is a Field Emission Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun. It was installed in 2012 and is ideal for the imaging of nano-structures with it’s full complement of both in-lens and below lens detectors. It has a resolution (sample dependent) of 0.8 nm at 15 kV and 1.2 nm at 1kV. It is equipped with a RAITH system for electron beam lithography.
Contact: Ron Rasch on email@example.com