The 7800 is a Field Emission Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun.  It was installed in 2012 and is ideal for the imaging of nano-structures with it’s full complement of both in-lens and below lens detectors.  It has a resolution (sample dependent) of 0.8 nm at 15 kV and 1.2 nm at 1kV.  It is equipped with a RAITH system for electron beam lithography.

Location: Don Nicklin Building #74 (Room 108A) 

Contact: Ron Rasch on  r.rasch@uq.edu.au

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