Hitachi SU3900 VP SEM (AMICS)

The Hitachi SU3900 scanning electron microscope has a large chamber size and a variable pressure capability. This allows the study of non-conductive samples (natural minerals, man-made ceramics, soil, dust) without coating. The microscope is equipped with a Bruker energy dispersive spectroscopy (EDS) detector, Esprit EDS analysis software, and AMICS automated mineralogy software. It is ideal for large area secondary electron (SE) or back scattered electron (BSE) imaging, elemental and phase mapping. Chemical analysis resolution is 1 micron.

Location: Long Pocket, Foxtail building, room 221

Contact: Andrew Kostryzhev, a.kostryzhev@uq.edu.au