Hitachi HF5000 Cs-STEM/TEM
A cold field emission transmission electron microscope fitted with spherical aberration corrector on the probe-forming lens systems. The HF5000 is capable of imaging atomic structures with a resolution of less than 100pm. It can acquire atomic chemical information using energy dispersive X-ray spectrometry (chemical information) and electron energy-loss spectroscopy (chemical and bonding information). The microscope provides electron tomography for three dimensional imaging of structures.
Location: Hawken Building #50 (Room L109)
Contact: Graeme Auchterlonie g.auchterlonie@uq.edu.au
Technical Configuration:
- Accelerating Voltages: 60, 80, 200kV;
- Filament: W (310) Cold-cathode FEG electric field
- Corrector: Cs probe corrector STEM
Cameras/Detectors:
- STEM
- SE: Secondary electron image mode
- ZCM: Dark Field Z Contrast Mode
- DCM: Dark Field Diffraction Contrast Mode
- PCM: Bright Field Phase Contrast Mode
- WAM: Bright Field Wide Angle Mode
- Cs-Ronchi: Ronchigram Observation Mode
- Cs-Measure: Aberration Mode Measurement
- ABF (option): Annular Shape Bright Field Mode
- Gatan in-situ OneView
- Gatan US1000 post spectrometer camera
- Oxford EDX 2x1sr 100mm SDD EDX
- Gatan Quantum ER GIF for EFTEM/EELS
- Merlin Quantum Pixelated Detector
Holders:
- Hitachi Single Tilt 876-109
- Hitachi Double Tilt 876-110
- Hitachi Double Tilt 877-119 Be St DCut
- Hitachi Double Tilt 876-101 TM
- Hitachi Double Tilt 877-107 AE
- Gatan Double Tilt Low Background 646
- Gatan Double Tilt Cryo 646
- Hitachi Electrochemical Holder