A cold field emission transmission electron microscope fitted with spherical aberration corrector on the probe-forming lens systems. The HF5000 is capable of imaging atomic structures with a resolution of less than 100pm. It can acquire atomic chemical information using energy dispersive X-ray spectrometry (chemical information) and electron energy-loss spectroscopy (chemical and bonding information). The microscope provides electron tomography for three dimensional imaging of structures.

Location: Hawken Building #50 (Room L109)

Technical Configuration:

  • Accelerating Voltages: 60, 80, 200kV;
  • Filament: W (310) Cold-cathode FEG electric field
  • Corrector: Cs probe corrector STEM


  • STEM
  • SE: Secondary electron image mode
  • ZCM: Dark Field Z Contrast Mode
  • DCM: Dark Field Diffraction Contrast Mode
  • PCM: Bright Field Phase Contrast Mode
  • WAM: Bright Field Wide Angle Mode
  • Cs-Ronchi: Ronchigram Observation Mode
  • Cs-Measure: Aberration Mode Measurement
  • ABF (option): Annular Shape Bright Field Mode 
  • Gatan in-situ OneView
  • Gatan US1000 post spectrometer camera
  • Oxford EDX 2x1sr 100mm SDD EDX
  • Gatan Quantum ER GIF for EFTEM/EELS
  • Merlin Quantum Pixelated Detector


  • Hitachi Single Tilt 876-109
  • Hitachi Double Tilt 876-110
  • Hitachi Double Tilt 877-119 Be St DCut
  • Hitachi Double Tilt 876-101 TM
  • Hitachi Double Tilt 877-107 AE
  • Gatan Double Tilt Low Background 646
  • Gatan Double Tilt Cryo 646
  • Hitachi Electrochemical Holder