Join us for a Frontiers in Microscopy Seminar.
Title: Understanding the Multi-scale Microscopy Challenge in Materials Science
When: 24th September – 14:30 to 15:30
Where: UQ St. Lucia; AIBN Level 1 Seminar Room
By: Dr. Bernd Schulz from Zeiss
Join this ZEISS seminar to learn about the multi-scale Sample-in-Volume Analysis (SIVA) workflow, which provides navigational guidance to connect modalities necessary for multi-scale imaging and analysis.
Correlative microscopy is a powerful and sophisticated microscopy approach that enables detailed subsurface sample analysis. As material science research advances, there is a need to understand the effect of microstructure and properties of a sample at different location and length scale. However, targeted identification and access of region of interests (ROIs) poses a challenge in the adoption of site-specific 3D microstructure characterisation. X-ray Microscopy (XRM) is used to non-destructively identify a ROI within a sample. Unlike conventional microCT that relies solely on geometric magnification, XRM can image larger samples while preserving highest resolution. The ROI identification can be assisted by tools like ZEISS Mineralogic 3D software for automated quantitative mineralogy. The identified ROI can be accessed through massive material ablation using a femtosecond (fs) laser integrated with a Focused Ion Beam Scanning Electron Microscope (FIB-SEM). The workflow offers a correlative link between the XRM and FIB-SEM stages, ensuring site-specific access to the ROI.
In this seminar the SIVA workflow will be demonstrated on example of a Geology sample, but the same workflow can be applied to Metals, Battery, Polymer, and even Biology research.
Speaker: Dr Bernd Schulz (bernd.schulz@zeiss.com)
Bernd looks after the Materials Science and Geology portfolio at ZEISS Australia and New Zealand. He holds a PhD in Metallurgy from UNSW Sydney and has over 10 years’ experience as Materials Scientist within academic research and the manufacturing industry.
All welcome!
