X-ray Analysis and Particle Characterisation Instruments

Contact: Dr Alison White
X-ray Material Science & Spectrometry Lab Manager

The X-ray analysis facility at CMM is based on level two of the Chemistry building and provides a range of X-ray techniques, including diffraction, scattering, spectroscopy and imaging, for studying chemical composition, nano-scale size and crystalline phases in a range of materials. The facility provides complementary techniques to the electron-based methods afforded by the AIBN, QBP and Hawken Laboratories and to the macromolecular diffraction facilities in the QBP laboratories through small-angle scattering and small-molecule diffraction techniques.

Chemistry Building 68
Level 2
68 Cooper Road 
St Lucia, Queensland 4072

 


NEW Sample Submission Process:

From Tuesday 22nd April the current paper sample submission forms will no longer be accepted.  Please click here to access the new form.  Once your sample submission request is approved, you will receive an email with a copy of your submission to print and enclose with your samples when you drop them off.

X-ray AnalysisParticle Characterisation
Xenocs Xeuss 2.0 SAXS Microtrac Sync, equipped with FlowSync wet module and TurboSync dry module
Bruker D8 Advance powder XRDKruss Droplet Shape Analysis
Rigaku SmartLab thin-film and micro-diffraction XRDMJet dispersion unit
Kratos Axis Supra Plus XPSMalvern Zetasizer Ultra
iXRF ATLAS X XFMMalvern Mastersizer 3000
NanoFilm EP3 Imaging EllipsometryNanoFCM NanoAnalyzer