The JEOL JEM2100 LaB6 S/TEM is an analytical transmission electron microscope which can be operated in TEM-microprobe, TEM-nanoprobe or STEM (Scanning Transmission Electron Microscope) mode. It is fitted with an Oxford SDD thin-window energy dispersive X-ray (EDS) detector which is capable of detecting elements ranging from boron upwards. The TEM operation is integrated within the Windows XP platform. A Gatan Orius 1000 slow scan CCD camera with 2k x 4k and video rate capture is fitted below the column. The S/TEM comes with a bright field (BF) and high-angle annular dark field (HAADF) STEM detectors located at the 35mm port. The instrument has an objective pole-piece that is capable of ±30° tilt. There is a cryo-sample holder (-183°C), double-tilt (±30°) holder, and double-tilt (±30°) low background (Be) EDS holders. This instrument was installed in 2009 and is used by researchers in the biological and physical sciences.

Location: AIBN

Contact: Graeme Auchterlonie on

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