PHILIPS XL30 SEM
The XL30 is a conventional SEM with a LaB6 source electron gun. It was installed in1998 and is equipped with secondary electron (SE) and backscatter electron (BSE) detectors as well as an Energy Dispersive (EDS/EDAX) x-ray analysis system. The XL30 also has an Oxford CT1500 Cryo transfer system fitted for cryo scanning electron microscopy (cryo-SEM) that allows suitable liquid or hydrated specimens to be examined frozen.
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JEOL JSM-7100F
The 7100 is a Field Emission Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun. It was installed in 2013 and is ideal for imaging and analysis of micro- and nano-structures. It has a resolution (sample dependent) of 1.2nm at 30kV and 3.0nm at 1kV. It is equipped with a GATAN Alto2500 cryo-preparation system for cryo scanning electron microscopy (cryo-SEM) that allows suitable liquid or hydrated specimens to be examined frozen. The 7100 also has a JEOL 129eV resolution silicon drift detector (SDD) for X-ray Energy Dispersive Spectroscope (EDS) microanalysis.
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JEOL JSM-6460LA
The 6460 is a variable pressure Scanning Electron Microscope (SEM) with a tungsten filament electron gun. It was installed in 2003 and is a user friendly instrument, ideal for novice and experienced users. In low vacuum mode, non-conductive and/or uncoated specimens can be imaged and analysed. The 6460 is equipped with a Minicup EDS for X-ray Energy Dispersive Spectroscope (EDS) microanalysis. The 6460 is also outfitted to provide live and interactive electron microscopy sessions for remote researchers, industry representatives, lecturers, education groups and other interested groups via CyberSTEM.
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JEOL JSM-7001F
The 7001 is a Field Emission Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun that is optimised for analytical applications. It offers very high beam currents with excellent stability even at lower acceleration voltages. It is fitted with two x-ray detectors: a conventional "user-friendly" EDS system; and a high spectral resolution WDS system that is ideal for observing low energy x-rays. Resolution is 1.2nm at 30kV and 2.0nm at 1kV using the inbuilt beam decelerator fitted to the stage.
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JEOL JSM-6610 SEM
This is a high resolution, analytical Scanning Electron Microscope that can reach 2.5nm resolution at an accelerating voltage of 30kV. The electron source is a LaB6 gun. It has a brighter source than the tungsten hairpin gun. Bright, high quality images can be obtained at all kV ranges from 1-30kV. It has a wide magnification range to observe a variety of samples from 10cm in diameter to nano-structures at very high magnification. This instrument is an ideal analytical system as it has an Oxford 50mm2 X-Max SDD x-ray detector attached that enables simultaneous imaging and elemental analysis at high count rates with 125eV energy resolution. It has also has an integrated Oxford/HKL EBSD detector for crystallographic analysis with nanoscale resolution.
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JEOL JSM-5000 NEOSCOPE
The Neoscope is an imaging table top Scanning Electron Microscope that can reach 20,000 times magnification. A tungsten wire type electron source is used. It has a Secondary Electron detector that operates in High Vacuum and a Backscatter Detector (Shadow mode only) that operates in Low Vacuum. It is easy to operate; can be learned in a short period of time and is simple to maintain. It can operate at 5kV, 10kV and 15kV. The maximum specimen size it can hold is 70mm diameter x 50mm height.
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JEOL JXA-8200 EPMA
The Neoscope is an imaging table top Scanning Electron Microscope that can reach 20,000 times magnification. A tungsten wire type electron source is used. It has a Secondary Electron detector that operates in High Vacuum and a Backscatter Detector (Shadow mode only) that operates in Low Vacuum. It is easy to operate; can be learned in a short period of time and is simple to maintain. It can operate at 5kV, 10kV and 15kV. The maximum specimen size it can hold is 70mm diameter x 50mm height.
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RENISHAW RAMAN MICROSCOPE
The Renishaw Raman microscope and spectrometer was installed 2008 and offers three laser wavelengths (325nm, 514nm and 785nm) for Raman vibrational analysis of bonds in oxides and organic specimens. The spectrometer is accurate to 1 wavenumber, and the laser spot may be positioned on the sample to a few microns. It is also possible to perform polarization, photoluminescence and confocal experiments on this microscope.
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HITACHI SU3500 SEM
The Hitachi SU3500 is a conventional tungsten emitter Scanning Electron Microscope that was installed in 2014. It is a variable pressure (VP) SEM capable of both high and low vacuum modes of operation. It is fitted with three electron detectors (ET-Secondary, BackScatter and Low Vacuum Secondary) and a very flexible and user friendly stage arrangement that holds multiple specimens.
If you have any questions regarding CMM's Hawken Lab, please contact the Hawken Lab Manager Ron Rasch on r.rasch@uq.edu.au