JEOL JEM-1010 TEM
The CMM has two JEM-1010 Transmission Electron Microscope’s which are used predominantly in the high through-put biological discipline. These are compact high performance TEM’s with advanced features and functions. The high contrast objective lens pole piece combines the highest possible contrast and brightness with optimum resolution essential for life science studies. The JEOL cool beam gun allows high-brightness, high coherence illumination conditions with low emission current.
Other features include user friendly controls, file storage, automatic filament heating, and automatic exposure micrograph photography.
These instruments are both equipped with Olympus Soft Imaging Solutions Veleta 2K x 2K wide angle digital cameras.
JEOL JEM-2100 TEM
The JEOL JEM2100 LaB6 STEM is an analytical transmission electron microscope which can be operated in TEM-microprobe, TEM-nanoprobe or STEM (Scanning Transmission Electron Microscope) mode. It is fitted with a JEOL thin-window energy dispersive X-ray (EDS) detector which is capable of detecting elements ranging from boron upwards. The TEM operation is integrated within the Windows XP platform. A Gatan Orius 1000 slow scan CCD camera with 2k x 4k and video rate capture is fitted below the column. The S/TEM comes with a bright field (BF) and high-angle annular dark field (HAADF) STEM detectors located at the 35mm port. The instrument has an objective pole-piece that is capable of ±30° tilt. There is a cryo-sample holder (-183°C), double-tilt (±30°) holder, and double-tilt (±30°) low background (Be) EDS holders. This instrument was installed in 2009 and is used by researchers in the biological and physical sciences.
The 7800 is a Field Emission Scanning Electron Microscope (FE-SEM) with a hot (Schottky) electron gun. It was installed in 2012 and is ideal for the imaging of nano-structures with it’s full complement of both in-lens and below lens detectors. It has a resolution (sample dependent) of 0.8 nm at 15 kV and 1.2 nm at 1kV. It is equipped with a RAITH system for electron beam lithography.
ZEISS SIGMA FESEM
This microscope is set up permanently with the Gatan 3View system which allows for Serial Blockface Scanning Electron Microscopy (SBGSEM). In this system a microtome equipped with a diamond knife if mounted inside the specimen chamber of the microscope. The specimen which is embedded in resin is cut with the knife and the remaining blockface is imaged at low kV in backscatter mode. This sectioning and imaging is performed over and over so that a three dimensional data set is acquired. A contrast inversion of the image results in an image that looks almost exactly like a standard TEM-type image of a biological sample. The sample processing involves impregnating heavy metals into the specimen so that it is highly conductive and is capable of producing a high signal in backscatter imaging mode.The system can acquire very large data sets as it can be left to continuously image and section for extremely long periods.
FEI F20 FEG-STEM
The Philips Tecnai F20 FEG-STEM is an analytical transmission electron microscope with the capability to deliver one nanoamp (10-9A) of current into a probe of one nanometre (10-9nm) in diameter. The unique analytical resolution is a result of the high brightness field emission gun (FEG) which acts an electron source in the microscope. The instrument can be operated in TEM-microprobe, TEM-nanoprobe or STEM (Scanning Transmission Electron Microscope) mode. It is fitted with an Oxford SDD X-ray (EDS) detector which is capable of detecting elements ranging from carbon upwards. The TEM operation is integrated within the Windows NT platform. A Gatan Image Filter (GIF) is fitted to the bottom of the microscope column along with a 4kx4k OneView CMOS camera. The GIF comes standard with a 2kx2k slow scan CCD, a bright field (BF), dark field (DF), and high-angle annular dark field (HAADF) STEM detectors are all located just above the entrance aperture for the GIF. The GIF is able to analyze elements from lithium upwards and thus is ideal for light element analysis. Just like EDS, the GIF can perform elemental analysis, but can also deliver bonding information at the nanoscale. The instrument has a twin-lens objective pole-piece and is capable of ±70°. There are cryo-sample holders (-183°C), double-tilt (±30°) low background (Be) EDS holder, a high temperature double-tilt holder (±30°) capable of heating samples up to 1000°C. The combined tilt axis and STEM versatility with analytical detectors makes this microscope an extremely useful tool, not only for those in the physical sciences, but the biological sciences as well.
FEI SCIOS FIB
The FEI Scios DualBeam system is a combination of two systems: a Scanning Electron Microscope (SEM) and a Focused Ion Beam (FIB) system. While the SEM produces high resolution images of a variety of specimens in a digital format, the FIB is capable of fast and precise site-specific milling of the specimen material, revealing the structure under the surface layer, making cross sections, deposition layers, etc. The integration of both systems yields a powerful analytical tool that delivers outstanding 2D and 3D performance for a broad range of applications. The SCIOS is equipped with three in-lens/column SE/BSE detectors, Everhart-Thornley SE detector, ICE detector (secondary electrons and ions), retractable segmented under lens BSE detector, and STEM retractable segmented detector (BF, DF, HADF, HAADF). An Oxford Instruments AZtec integrated EDS-EBSD system is installed for elemental composition and crystal structure characterizations. This instrument is fitted with four Gas Injection System (GIS) units for beam-induced deposition or etching purposes: Platinum, Silicon Oxide, Tungsten and Selective Carbon Etch. The system also offers a package of software applications for automated sequential mill and acquire of series of slice images and EDS (chemical maps)/EBSD (texture or orientation maps) maps and subsequent 3D reconstruction.